This website uses cookies

We uses cookies to improve user experience. Choose what cookies you allow us to use. You can read more about our Cookie Policy in our Privacy Policy.

Modern methods of investigation for understanding of new materials

Atomic force microscopy (AFM) provides diverse data of the investigated samples. These data need to be interpreted in a meaningful way, because the true value of the experiment is exploited in their relation to the desired materials and application properties.

The heart of an atomic force microscope for surface investigation is the palm-sized scanner unit. It steers a scanning tip, mounted on its end, with sub-nanometer-precision, providing a spatial resolution that corresponds to the size of individual atoms.

Clipdetails

04/25/17
00:06:26
Footage
16:9 HD
Track 1: Atmo,Track 2: Atmo
05/24/16
Ludwigshafen - B007
BASF SE
BASF SE
BASF SE 2017

Downloads

TOP